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contact microscopy

См. также в других словарях:

  • Contact lens — Contacts redirects here. For the software application, see Address book. A pair of contact lenses, positioned with the concave side facing upward …   Wikipedia

  • Contact lens — Lentilles de contact Verres de contact posés avec la face concave vers le haut …   Wikipédia en Français

  • Contact lenses — Lentilles de contact Verres de contact posés avec la face concave vers le haut …   Wikipédia en Français

  • Contact resistance — The term contact resistance refers to the contribution to the total resistance of a material which comes from the electrical leads and connections as opposed to the intrinsic resistance, which is an inherent property, independent of the… …   Wikipedia

  • Software tools for molecular microscopy — There are a large number of software tools or software applications that have been specifically developed for the field sometimes referred to as molecular microscopy or cryo electron microscopy or cryoEM. Several special issues of the Journal of… …   Wikipedia

  • Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …   Wikipedia

  • Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

  • Chemical force microscopy — Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. Chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.… …   Wikipedia

  • Conductive atomic force microscopy — (C AFM) is a variation of atomic force microscopy (AFM) and scanning tunneling microscopy (STM), which uses electrical current to construct the surface profile of the studied sample. The current is flowing through the metal coated tip of the… …   Wikipedia

  • Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

  • Scanning capacitance microscopy — (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is held just above the surface of a sample and scanned across the sample. SCM characterizes the surface of the sample using information obtained from the change in… …   Wikipedia

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